Direct Observation of Surface States at the TiO2 Electrolyte Interface

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dc.contributor.authorSiripala Wen_US
dc.contributor.authorTomkiewicz Men_US
dc.date.accessioned2014-11-19T04:45:40Z
dc.date.available2014-11-19T04:45:40Z
dc.date.issued1981
dc.description.abstractRelaxation Spectrum Analysis was suggested as a general technique for mearsurements of charge accumulation modes and their corresponding relaxation times at the space charge layer of a semiconductor with strong emphasis on semiconductor liquid junction interfaces. Among all the reported results(2-4),none was, as yet, confirmed by an independent technique.en_US
dc.identifier.departmentPhysicsen_US
dc.identifier.issn0013-4651(Print ) ,1945-7111(Online)en_US
dc.identifier.urihttp://repository.kln.ac.lk/handle/123456789/4070
dc.publisherJournal of Electrochemical Societyen_US
dc.subjectSurface statesen_US
dc.subjectTiO2en_US
dc.subjectElectrolyteen_US
dc.titleDirect Observation of Surface States at the TiO2 Electrolyte Interface
dc.typearticleen_US

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