Characterization of Surface States at a Semiconductor Electrolyte Interface by Electroreflectance Spectroscopy

dc.contributor.authorTomkiewicz Men_US
dc.contributor.authorSiripala Wen_US
dc.date.accessioned2014-11-19T04:46:40Z
dc.date.available2014-11-19T04:46:40Z
dc.date.issued1983
dc.description.abstractSupra bandgap and subband gap Electrolyte Electroreflectance is being used to characterize surface states at semiconductor liquid interfaces. The surface states can manifest themselves either through direct optical transitions as in the case of n - TiO2 - aqueous electrolyte interface or through their effect on the response of the Fermi level to small changes in the electrode potential as in the case of single crystal CdIn2Se4 in polysulfide solutions.en_US
dc.identifier.departmentPhysicsen_US
dc.identifier.uri
dc.identifier.urihttp://repository.kln.ac.lk/handle/123456789/4136
dc.publisherJournal De Physiqueen_US
dc.subjectElectrolytes; Spectrum analysis; Surfaces; Surfaces (Physics)en_US
dc.titleCharacterization of Surface States at a Semiconductor Electrolyte Interface by Electroreflectance Spectroscopy
dc.typearticleen_US

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